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Title Advanced Techniques and Applications on Scanning Probe Microscopy
ISBN 978-81-7895-378-6
Price
Individual 110 USD
Institutional 110 USD
Editor(s) J.L. Bubendorff and F.H. Lei
Preface Since its invention in the last 80th, the scanning probe microscopy (SPM) is continuously developing in its techniques and applications. Now SPM family such as scanning tunnelling microscopy (STM), at     Read More >>

  

  
  
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